Amazon cover image
Image from Amazon.com

Extreme Value Modeling and Risk Analysis : Methods and Applications / Ed. Dey, Dipak K. and Yan, Jun.

Contributor(s): Material type: TextTextLanguage: English Publication details: Boca Raton : CRC Press, ©2016.Description: xx, 520 pISBN:
  • 9780367737399
Subject(s): DDC classification:
  • 519.2 DEY/E
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode
Books Books Indian Institute of Technology Tirupati General Stacks Mathematics 519.2 DEY/E (Browse shelf(Opens below)) Checked out 07/03/2026 09820

There are no comments on this title.

to post a comment.
Previous
Back to results
Next
Close