Semiconductor Material and Device Characterization /

Schroder, Dieter K.

Semiconductor Material and Device Characterization / Dieter K. Schroder. - 3rd Ed. - New Jersy : John Wiley, c2006. - xv, 779p.

"Wiley-Interscience."

0471739065 (acidfree paper) 9780471739067


Semiconductors.
Semiconductors--Testing.

621.38152 / SCH/S