Fundamentals of Atomic Force Microscopy (Record no. 2376)

MARC details
000 -LEADER
fixed length control field 02007cam a2200313 a 4500
001 - CONTROL NUMBER
control field 00009343
003 - CONTROL NUMBER IDENTIFIER
control field WSP
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230529154726.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr mn|---uuuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 141125s2016 si a ob 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2014029164
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789814630375
040 ## - CATALOGING SOURCE
Original cataloging agency WSPC
Language of cataloging eng
Transcribing agency WSPC
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.82
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Reifenberger, Ronald G.
245 10 - TITLE STATEMENT
Title Fundamentals of Atomic Force Microscopy
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Singapore :
Name of publisher, distributor, etc. World Scientific Publishing Co. Pte Ltd.,
Date of publication, distribution, etc. c2015.
300 ## - PHYSICAL DESCRIPTION
Extent 340 p. :
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Lessons from Nanoscience: A Lecture Notes Series :
Volume/sequential designation Vol. 4
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Part I: Foundations
520 ## - SUMMARY, ETC.
Summary, etc. "The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)"--
Assigning source Provided by publisher.
533 ## - REPRODUCTION NOTE
Type of reproduction Electronic reproduction.
Place of reproduction Singapore :
Agency responsible for reproduction World Scientific,
Date of reproduction 2015.
538 ## - SYSTEM DETAILS NOTE
System details note Mode of access: World Wide Web. System requirements: Adobe Acrobat Reader.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Atomic force microscopy.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic books.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://www.worldscientific.com/worldscibooks/10.1142/9343#t=toc">http://www.worldscientific.com/worldscibooks/10.1142/9343#t=toc</a>
Public note ebook
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type E-Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Indian Institute of Technology Tirupati Indian Institute of Technology Tirupati 06/02/2018   502.82 EB00286 06/02/2018 06/02/2018 E-Books