Kelvin Probe Force Microscopy : (Record no. 6802)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01458 a2200181 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20251009174023.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 251009b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319756868 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 530.8 |
| Item number | SadK |
| 245 ## - TITLE STATEMENT | |
| Title | Kelvin Probe Force Microscopy : |
| Remainder of title | From Single Charge Detection to Device Characterization / |
| Statement of responsibility, etc | edited by Sascha Sadewasser Thilo Glatzel |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Springer : |
| Place of publication | Nature Switzerland , |
| Year of publication | ©2018. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xxiv,521p. |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Springer Series in Surface Sciences |
| Volume number/sequential designation | 65 |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Microscopy |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Glatzel, Thilo |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Purchase Price | Bill number | Full call number | Accession Number | Print Price | Bill Date/Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Physics | Indian Institute of Technology Tirupati | Indian Institute of Technology Tirupati | General Stacks | 07/10/2025 | Shah Book House | 14284.88 | SBH/28599 | 530.8 SadK (12216) | 12216 | 20406.97 | 07/10/2025 | Books |