X-Ray Absorption Spectroscopy of Semiconductors / (Record no. 7113)

MARC details
000 -LEADER
fixed length control field 02174 a2200253 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251014154323.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 241207b |||||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783662443613
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38
Item number SchX
245 ## - TITLE STATEMENT
Title X-Ray Absorption Spectroscopy of Semiconductors /
Statement of responsibility, etc edited by Claudia S. Schnohr and Mark C. Ridgway
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Berlin:
Name of publisher Springer;
Year of publication ©2015
300 ## - PHYSICAL DESCRIPTION
Number of Pages xiii, 361p.
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Springer Series in Optical Sciences
520 ## - SUMMARY, ETC.
Summary, etc X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Applied physics
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Semiconductors
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Optical and Electronic Materials
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Spectroscopy and Microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Classical Electrodynamics
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Schnohr, Claudia S. [Ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Ridgway, Mark C. [Ed.]
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Collection code Home library Current library Shelving location Date acquired Source of acquisition Purchase Price Bill number Full call number Accession Number Copy number Print Price Bill Date/Price effective from Koha item type
      Physics Indian Institute of Technology Tirupati Indian Institute of Technology Tirupati General Stacks 30/07/2025 Today and Tomorrows Printers and Publishers 7054.59 TTPP/135/2025-26 621.38 SchX (11576) 11576 Copy 1 10077.99 30/07/2025 Books