Novel Deep Learning Based Phase Unwrapping Approaches for Optical Metrology and MRI / (Record no. 7367)

MARC details
000 -LEADER
fixed length control field 00525nam a22001697a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 250823b |||||||| |||| 00| 0 eng d
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3
Item number VenN
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Vengala,Krishna Sumathi
Registration Number EE20D501
245 ## - TITLE STATEMENT
Title Novel Deep Learning Based Phase Unwrapping Approaches for Optical Metrology and MRI /
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Tirupati :
Name of publisher, distributor, etc IIT Tirupati,
Date of publication, distribution, etc 18/06/2025.
300 ## - PHYSICAL DESCRIPTION
Extent xiii,103p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electrical Engineering
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Rama Krishna Gorthi
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Sai Subramanyam Gorthi
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Thesis
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Koha item type
    Dewey Decimal Classification   Not For Loan Electrical Indian Institute of Technology Tirupati Indian Institute of Technology Tirupati Reference 23/08/2025   621.3 VenN TH049 23/08/2025 Thesis