Extreme Value Modeling and Risk Analysis : Methods and Applications / Ed. Dey, Dipak K. and Yan, Jun.

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Indian Institute of Technology Tirupati General Stacks	Mathematics	519.2 DEY/E (Browse shelf(Opens below))	Checked out	07/03/2026	09820

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