Bushnell, Michael L. <br/><br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / 
Michael L. Bushnell, Vishwani D. Agrawal. 
 - NEWDELHI  SPRINGER  c2000. 
 - xviii, 690 p. : 
 - Frontiers in electronic testing ;  17 .
<br/><br/><label>ISBN: </label>0792379918 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing.<br/>Digital integrated circuits--Testing.<br/>Mixed signal circuits--Testing.<br/>Semiconductor storage devices--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.395  / BUS/E