Schroder, Dieter K. <br/><br/>
Semiconductor Material and Device Characterization / 
Dieter K. Schroder. 
 - 3rd Ed. 
 - New Jersy :  John Wiley,  c2006. 
 - xv, 779p.  
<br/><br/> "Wiley-Interscience." 
<br/><br/><label>ISBN: </label>0471739065 (acidfree paper) 9780471739067 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Semiconductors--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.38152  / SCH/S