TY  - BOOK
AU  - Schroder,Dieter K.
TI  - Semiconductor Material and Device Characterization
SN  - 0471739065 (acidfree paper)
U1  - 621.38152 
PY  - 2006///
CY  - New Jersy
PB  - John Wiley
KW  - Semiconductors
KW  - Testing
N1  - "Wiley-Interscience."
ER  -