Lillesand, Thomas M. Kiefer, Ralph W. Chipman, Jonathan W. <br/><br/>
Remote Sensing and Image Interpretation /  
Thomas M. Lillesand, Ralph W. Kiefer and Jonathan W. Chipman  
 - 7th Ed. 
 - New Delhi :   Wiley,   ©2023. 
 - xix, 719p. 
<br/><br/><label>ISBN: </label>9789354642104 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical engineering --Technology
<br/><br/><label>Dewey Class. No.: </label>621.3678  / LirR