TY  - BOOK
AU  - Brundle, Richard 
AU  - Brundle,C.R.
AU  - Evans,Charles A.
AU  - Wilson,Shaun
TI  - Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin films
SN  - 0750691689
U1  - 620.44 
PY  - 1992///
CY  - Boston
PB  - Butterworth-Heinemann
KW  - Surfaces (Technology)
KW  - Testing
N1  - managing editor, Lee E. Fitzpatrick
ER  -