Vengala,Krishna Sumathi  EE20D501 <br/><br/>
Novel Deep Learning Based Phase Unwrapping Approaches for Optical Metrology and MRI / 

 - Tirupati :  IIT Tirupati,  18/06/2025. 
 - xiii,103p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical Engineering
<br/><br/><label>Dewey Class. No.: </label>621.3  / VenN