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007			cr mn|---uuuuu
008			141125s2016 si a ob 001 0 eng
010			_a 2014029164
020			_a9789814630375
040			_aWSPC _beng _cWSPC
082	0	0	_a502.82 _223
100	1		_aReifenberger, Ronald G.
245	1	0	_aFundamentals of Atomic Force Microscopy
260			_aSingapore : _bWorld Scientific Publishing Co. Pte Ltd., _cc2015.
300			_a340 p. :
440			_aLessons from Nanoscience: A Lecture Notes Series : _vVol. 4
504			_aIncludes bibliographical references and index.
505			_aPart I: Foundations
520			_a"The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)"-- _cProvided by publisher.
533			_aElectronic reproduction. _bSingapore : _cWorld Scientific, _d2015.
538			_aMode of access: World Wide Web. System requirements: Adobe Acrobat Reader.
650		0	_aAtomic force microscopy.
650		0	_aElectronic books.
856	4	0	_uhttp://www.worldscientific.com/worldscibooks/10.1142/9343#t=toc _zebook
942			_2ddc _cEBK
999			_c2376 _d2376