| 000 | 00816cam a22002294a 4500 | ||
|---|---|---|---|
| 005 | 20250227101144.0 | ||
| 008 | 000829s2000 maua b 001 0 eng | ||
| 020 | _a0792379918 | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.395 _bBUS/E |
| 100 | 1 | _aBushnell, Michael L. | |
| 245 | 1 | 0 |
_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / _cMichael L. Bushnell, Vishwani D. Agrawal. |
| 260 |
_aNEWDELHI _bSPRINGER _cc2000. |
||
| 300 | _axviii, 690 p. : | ||
| 440 | 0 |
_aFrontiers in electronic testing ; _v17 |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aDigital integrated circuits _xTesting. |
|
| 650 | 0 |
_aMixed signal circuits _xTesting. |
|
| 650 | 0 |
_aSemiconductor storage devices _xTesting. |
|
| 700 | 1 | _aAgrawal, Vishwani D., | |
| 942 | _cBK | ||
| 999 |
_c4045 _d4045 |
||