| 000 | 00618cam a2200217 a 4500 | ||
|---|---|---|---|
| 005 | 20230606162412.0 | ||
| 008 | 050420s2006 njua b 001 0 eng | ||
| 020 | _a0471739065 (acidfree paper) | ||
| 020 | _a9780471739067 | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.38152 _bSCH/S |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 1 | 0 |
_aSemiconductor Material and Device Characterization / _cDieter K. Schroder. |
| 250 | _a3rd Ed. | ||
| 260 |
_aNew Jersy : _bJohn Wiley, _cc2006. |
||
| 300 | _axv, 779p. | ||
| 500 | _a"Wiley-Interscience." | ||
| 650 | 0 | _aSemiconductors. | |
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 942 | _cBK | ||
| 999 |
_c4437 _d4437 |
||