| 000 | 00732pam a2200229 a 4500 | ||
|---|---|---|---|
| 005 | 20250714122046.0 | ||
| 008 | 920401s1992 maua be 001 0 eng | ||
| 020 | _a0750691689 | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a620.44 _bBruE |
| 100 | _aBrundle, Richard | ||
| 245 | 0 | 0 |
_aEncyclopedia of Materials Characterization: _bSurfaces, Interfaces, Thin films/ _cEdited by C. Richard Brundle...[et al] |
| 260 |
_aBoston : _bButterworth-Heinemann, _c©1992. |
||
| 300 | _axix, 751p. | ||
| 440 | 0 | _aMaterials characterization series | |
| 500 | _amanaging editor, Lee E. Fitzpatrick. | ||
| 650 | 0 |
_aSurfaces (Technology) _xTesting. |
|
| 700 | 1 | _aBrundle, C.R. | |
| 700 | 1 | _aEvans, Charles A. | |
| 700 | 1 | _aWilson, Shaun. | |
| 942 | _cBK | ||
| 999 |
_c4575 _d4575 |
||