000			01458 a2200181 4500
005			20251009174023.0
008			251009b |||||||| |||| 00| 0 eng d
020			_a9783319756868
082			_a530.8 _bSadK
245			_aKelvin Probe Force Microscopy : _bFrom Single Charge Detection to Device Characterization / _cedited by Sascha Sadewasser Thilo Glatzel
260			_bSpringer : _aNature Switzerland , _c©2018.
300			_axxiv,521p.
440			_aSpringer Series in Surface Sciences _v65
520			_aThis book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field
650			_aMicroscopy
700			_aGlatzel, Thilo
942			_cBK
999			_c6802 _d6802