000			02174 a2200253 4500
005			20251014154323.0
008			241207b |||||||| |||| 00| 0 eng d
020			_a9783662443613
041			_aeng
082			_a621.38 _bSchX
245			_aX-Ray Absorption Spectroscopy of Semiconductors / _cedited by Claudia S. Schnohr and Mark C. Ridgway
260			_aBerlin: _bSpringer; _c©2015
300			_axiii, 361p.
440			_aSpringer Series in Optical Sciences
520			_aX-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
650			_aApplied physics
650			_aSemiconductors
650			_aOptical and Electronic Materials
650			_aSpectroscopy and Microscopy
650			_aClassical Electrodynamics
700			_aSchnohr, Claudia S. [Ed.]
700			_aRidgway, Mark C. [Ed.]
942			_cBK
999			_c7113 _d7113