Novel Deep Learning Based Phase Unwrapping Approaches for Optical Metrology and MRI /

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Tirupati : IIT Tirupati, 18/06/2025.Description: xiii,103pSubject(s): DDC classification:
  • 621.3 VenN
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Item type Current library Collection Call number Status Barcode
Thesis Thesis Indian Institute of Technology Tirupati Reference Electrical 621.3 VenN (Browse shelf(Opens below)) Not For Loan TH049

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